The Study of Low-Light Sights Reliability Test System in High and Low Temperature Environment

Jie DUAN; Kejuan XUE; Danni LI; Xiangyang SUN

doi:10.3968/%x

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Jie DUAN
School of Electro-Optical Engineering, Changchun University of Science and Technology, Changchun, China.

Kejuan XUE
School of Electro-Optical Engineering, Changchun University of Science and Technology, Changchun, China.

Danni LI
School of Electro-Optical Engineering, Changchun University of Science and Technology, Changchun, China.

Xiangyang SUN
School of Electro-Optical Engineering, Changchun University of Science and Technology, Changchun, China. School of Electronic Information Engineering, Changchun University, Changchun, China.

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DOI: http://dx.doi.org/10.3968/%25x

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